Characteristic impedance

Results: 43



#Item
11Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

Accurate Characteristic Impedance Measurement on Silicon Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@boul

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Source URL: www.nist.gov

Language: English - Date: 2010-07-20 13:22:52
12Computation of Causal Characteristic Impedances Dylan F. Williams, Senior Member, IEEE, and Ronald C. Wittmann, Senior Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+1]

Computation of Causal Characteristic Impedances Dylan F. Williams, Senior Member, IEEE, and Ronald C. Wittmann, Senior Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+1]

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Source URL: www.nist.gov

Language: English - Date: 2010-07-20 13:22:52
13Causal Characteristic Impedance of Planar Transmission Lines Dylan F. Williams, Fellow, IEEE, and Bradley K. Alpert, Member, IEEE, Uwe Arz1, David K. Walker, and Hartmut Grabinski1 National Institute of Standards and Tec

Causal Characteristic Impedance of Planar Transmission Lines Dylan F. Williams, Fellow, IEEE, and Bradley K. Alpert, Member, IEEE, Uwe Arz1, David K. Walker, and Hartmut Grabinski1 National Institute of Standards and Tec

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Source URL: www.eeel.nist.gov

Language: English - Date: 2002-08-02 18:07:30
14IEEE MICROWAVE AND GUIDED WAVE LETTERS, VOL. 9, NO. 5, MAY[removed]Characteristic Impedance, Power, and Causality Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE

IEEE MICROWAVE AND GUIDED WAVE LETTERS, VOL. 9, NO. 5, MAY[removed]Characteristic Impedance, Power, and Causality Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE

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Source URL: www.eeel.nist.gov

Language: English - Date: 1999-07-01 13:52:58
15Causality and Characteristic Impedance Dylan F. Williams and Bradley K. Alpert National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@

Causality and Characteristic Impedance Dylan F. Williams and Bradley K. Alpert National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dylan@

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Source URL: www.eeel.nist.gov

Language: English - Date: 1999-11-08 20:18:26
16IEEE TRANSACTIONS ON ADVANCED PACKAGING, VOL. 26, NO. 2, MAY[removed]Causal Characteristic Impedance of Planar Transmission Lines

IEEE TRANSACTIONS ON ADVANCED PACKAGING, VOL. 26, NO. 2, MAY[removed]Causal Characteristic Impedance of Planar Transmission Lines

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Source URL: www.eeel.nist.gov

Language: English - Date: 2003-09-30 12:36:36
17Computation of Causal Characteristic Impedances Dylan F. Williams, Senior Member, IEEE, and Ronald C. Wittmann, Senior Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+1]

Computation of Causal Characteristic Impedances Dylan F. Williams, Senior Member, IEEE, and Ronald C. Wittmann, Senior Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+1]

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Source URL: www.eeel.nist.gov

Language: English - Date: 2000-03-06 18:55:40
18Characteristic-Impedance Measurement Error on Lossy Substrates Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dyla

Characteristic-Impedance Measurement Error on Lossy Substrates Dylan F. Williams National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed]Fax: [+[removed]E-mail: dyla

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Source URL: www.eeel.nist.gov

Language: English - Date: 2001-07-02 17:51:12
19Comments on “Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances” Dylan F. Williams, IEEE Senior Member and Roger B. Marks, IEEE Senior Member National Instit

Comments on “Conversions Between S, Z, Y, h, ABCD, and T Parameters which are Valid for Complex Source and Load Impedances” Dylan F. Williams, IEEE Senior Member and Roger B. Marks, IEEE Senior Member National Instit

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Source URL: www.eeel.nist.gov

Language: English - Date: 1998-03-15 16:38:28
20Characteristic Impedance of Microstrip on Silicon Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed])

Characteristic Impedance of Microstrip on Silicon Dylan F. Williams, Senior Member, IEEE, and Bradley K. Alpert, Member, IEEE National Institute of Standards and Technology, 325 Broadway, Boulder, CO[removed]Ph: [+[removed])

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Source URL: www.eeel.nist.gov

Language: English - Date: 1999-08-10 15:40:12